Publikationen 2014

Spectral performance of DEPFET and gateable DEPFET macropixel devices, Bähr A., Aschauer S., Bergbauer B., Hermenau K., Lauf T., Lechner P., Lutz G., Majewski P., Meidinger N., Miessner D., Porro M., Richter R., Schaller G., Schopper F., Stefanescu A., Strüder L., Treis J., 2014, Journal of Instrumentation, 9, 3

 

Development of DEPFET active pixel sensors to improve the spectroscopic response for high time resolution applications, Bähr A., Aschauer S., Bergbauer B., Lechner P.H., Majewski P., Meidinger N., Ott S.M., Porro M., Richter R.H., Strüder L., Treis J., 2014, Proceedings of SPIE - The International Society for Optical Engineering, 9144,  

 

VERITAS 2.0 a multi-channel readout ASIC suitable for the DEPFET arrays of the WFI for Athena, Porro M., Bianchi D., De Vita G., Herrmann S., Wassatsch A., Bähr A., Bergbauer B., Meidinger N., Ott S., Treis J., 2014, Proceedings of SPIE - The International Society for Optical Engineering, 9144,  

 

Prospects and limitations of DEPFET active pixel sensors as high speed spectroscopic x-ray imager for the ATHENA wide field imager, Aschauer S., Bähr A., Lutz G., Majewski P., Strüder L., Treis J., 2014, Proceedings of SPIE - The International Society for Optical Engineering, 9144,  

 

Toward atomic resolution diffractive imaging of isolated molecules with X-ray free-electron lasers, Stern S., Holmegaard L., Filsinger F., Rouzée A., Rudenko A., Johnsson P., Martin A.V., Barty A., Bostedt C., Bozek J., Coffee R., Epp S., Erk B., Foucar L., Hartmann R., Kimmel N., Kühnel K.-U., Maurer J., Messerschmidt M., Rudek B., Starodub D., Thøgersen J., Weidenspointner G., White T.A., Stapelfeldt H., Rolles D., Chapman H.N., Küpper J., 2014, Faraday Discussions, 171,  

 

All-silicon multi-chip modules based on ultra-thin active pixel radiation sensors, Andricek L., Koffmane C., Ninkovic J., Richter R., 2014, International Conference and Exhibition on Device Packaging 2014,  

 

Electrical characterization of different DEPFET designs on die level, Bergbauer B., Aschauer S., Bähr A., Hermenau K., Horstmann J., Lauf T., Lechner P., Majewski P., Meidinger N., Reiffers J., Richter R., Sandow C., Schaller G., Schopper F., Stefanescu A., Strüder L., Treis J., 2014, Journal of Instrumentation, 9, 1

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