Publikationen 2015-2017


Sensor development at the semiconductor laboratory of the Max-Planck-Society, Bähr A., Lechner P., Ninkovic J., 2017, Journal of Instrumentation, 12, 12


DEPFET detectors for direct detection of MeV Dark Matter particles, Bähr A., Kluck H., Ninkovic J., Schieck J., Treis J., 2017, European Physical Journal C, 77, 12


Modeling of DEPFET based X-ray detectors for athena's wide field imager, Ott S., Andritschke R., Bähr A., Meidinger N., Müller-Seidlitz J., Plattner M., Stechele W., Treberspurg W., 2017, 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016, 2017-January,  


Hardware-Accelerated CCD readout smear correction for Fast Solar Polarimeter, Tabel S., Weikl K., Stechele W., 2017, Proceedings of the International Conference on Application-Specific Systems, Architectures and Processors,  


Fast computation of readout smear correction for framestore CCD based images, Tabel S., Stechele W., 2017, ACM International Conference Proceeding Series, Part F130523,


Characterization and optimization of a thin direct electron detector for fast imaging applications, Dourki I., Westermeier F., Schopper F., Richter R.H., Andricek L., Ninkovic J., Treis J., Koffmane C., Wassatsch A., Peric I., Epp S.W., Miller R.J.D., 2017, Journal of Instrumentation, 12, 3


A novel Silicon Photomultiplier with bulk integrated quench resistors: utilization in optical detection and tracking applications for particle physics, Petrovics S., Andricek L., Diehl I., Hansen K., Jendrysik C., Krueger K., Lehmann R., Ninkovic J., Reckleben C., Richter R., Schaller G., Schopper F., Sefkow F., 2017, Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 845,


Studies of prototype DEPFET sensors for the Wide Field Imager of Athena, Treberspurg W., Andritschke R., Bähr A., Behrens A., Hauser G., Lechner P., Meidinger N., Müller-Seidlitz J., Treis J., 2017, Proceedings of SPIE - The International Society for Optical Engineering, 10397,  


Zur Redakteursansicht