Publikationen 2000
2000
Room temperature X- and gamma-ray spectroscopy with silicon drift detectors, Strüeder L., Hartmann R., Kemmer S., Krause N., Stöetter D., Lutz G., Solc P., Holl P., Lechner P., Leutenegger P., Kemmer J., Soltau H., Stöetter R., Weber U., Castoldi A., Fiorini C., Gatti E., Guazzoni C., Longoni A., Sampietro M., 2000, Proceedings of SPIE - The International Society for Optical Engineering, 4141, 1
Effect of low energy protons on the performance of the EPIC pn-CCD detector on XMM-Newton, Kendziorra E., Clauß T., Meidinger N., Kirsch M., Kuster M., Risse P., Hartner G., Staubert R., Strüeder L., 2000, Proceedings of SPIE - The International Society for Optical Engineering, 4140, 1
Novel digital K-edge imaging system with transition radiation from an 855 MeV electron beam, Hagenbuck F., Backe H., Clawiter N., Euteneuer H., Görgen F., Holl P., Johann K., Kaiser K.-H., Kemmer J., Kerschner Th., Kettig O., Koch H., Kube G., Lauth W., Matthäy H., Schütrumpf M., Stötter R., Strüder L., Walcher Th., Wilms A., Zanthier C.V., Zemter M., 2000, IEEE Nuclear Science Symposium and Medical Imaging Conference, 3,
Spectroscopic-grade X-ray imaging up to 100 kHz frame rate with controlled-drift detectors, Castoldi A., Guazzoni C., Rehak P., Strüder L., 2000, IEEE Nuclear Science Symposium and Medical Imaging Conference, 1,
Silicon drift detectors with spiralling electron transport and reduced lateral broadening, Castoldi A., Guazzoni C., Strüder L., 2000, IEEE Nuclear Science Symposium and Medical Imaging Conference, 1,
High-resolution imaging X-ray spectrometers, Strüder L., 2000, Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 454, 1
First operation of a pixel imaging matrix based on DEPFET pixels, Fischer P., Kemmer J., Klein P., Löcker M., Lutz G., Neeser W., Strüder L., Wermes N., 2000, Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 451, 3
The controlled-drift detector, Castoldi A., Gatti E., Guazzoni C., Longoni A., Rehak P., Strüder L., 2000, Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 439, 2-3
Metal contamination analysis of the epitaxial starting material for scientific CCDs, Krause N., Soltau H., Hauff D., Kemmer J., Stötter D., Strüder L., Weber J., 2000, Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 439, 2
Fabrication, test and performance of very large X-ray CCDs designed for astrophysical applications, Soltau H., Kemmer J., Meidinger N., Stötter D., Strüder L., Trümper J., Zanthier C.V., Bräuniger H., Briel U., Carathanassis D., Dennerl K., Engelhard S., Haberl F., Hartmann R., Hartner G., Hauff D., Hippmann H., Holl P., Kendziorra E., Krause N., Lechner P., Pfeffermann E., Popp M., Reppin C., Seitz H., Solc P., StadlbauerTh., Weber U., Weichert U., 2000, Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 439, 2
Bipolar feedback transistor integrated on detector with JFET for continuous reset, Sampietro M., Fasoli L., Gatti E., Guazzoni C., Fazzi A., Lechner P., Kemmer J., Hauf D., Struder L., 2000, Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 439, 2
Fast silicon drift photodiodes free from bias connections on the light entering side, Castoldi A., Chen W., Gatti E., Holl P., Rehak P., 2000, Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 439, 2
Works of art investigation with silicon drift detectors, Leutenegger P., Longoni A., Fiorini C., Strüder L., Kemmer J., Lechner P., Sciuti S., Cesareo R., 2000, Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 439, 2
Current and capacitance measurements as a fast diagnostic tool for evaluation of semiconductor parameters, Kemmer J., Hauff D., Krause N., Krieglmeyer Ch., Yinxiang Y., 2000, Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 439, 2